CAS STNext® e-Seminar: Searching for Japanese Patent Information

Many databases on CAS STNext have Japanese patent information. This e-seminar will identify those databases and their specific Japanese patent coverage. The session will also cover the differences in patent number formats over time, the various kind codes used by the Japanese patent office, and the two Japanese classification systems (FCL and FTERM). Links to the Japanese national register will also be discussed. This e-seminar is geared to searchers of all levels.